Electron tube and crystal diode experience in computing equipment

Abstract

Three years ago, the first Conference on Electron Tubes for Computers was held in Atlantic City. At that meeting a paper of similar title was presented, outlining field experience with electron tubes employed in widely used IBM products. Data prepared at the time illustrated common causes and frequency of tube failure, as determined by laboratory analysis and statistics maintained on field replaced components. The program from which this data evolves is continuous, and since its inception in early 1949, has provided a substantial reduction in field tube failures. In some instances, improvement in machine performance has resulted from the introduction of newly developed tube types, and in others from corrections made in misapplication of existing tubes. It is the purpose of this paper to outline the program of component improvement phases of computer manufacturing.