A group of about 60 conference members met to discuss diagnostic checks. Many of the conferees contributed to the discussion but in this summary no attempt is made to associate the individual members or their affiliation with their comments.
{"title":"Group discussion on diagnostic checks","authors":"J. Eachus","doi":"10.1145/1434878.1434908","DOIUrl":"https://doi.org/10.1145/1434878.1434908","url":null,"abstract":"A group of about 60 conference members met to discuss diagnostic checks. Many of the conferees contributed to the discussion but in this summary no attempt is made to associate the individual members or their affiliation with their comments.","PeriodicalId":384732,"journal":{"name":"AIEE-IRE '53 (Eastern)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1953-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122452658","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In attending the numerous technical conventions and symposia that are held each year, we listen to many learned papers. Problems important to our daily work are thoroughly discussed. Generally we return home with ideas that will forward our own engineering investigations. But we often find the problems discussed are larger than the individual or organization can handle. With mounting technical complexity, these problems are more frequently encountered.
{"title":"The RETMA support of the 1950 computer conference: a progress report","authors":"T. H. Briggs","doi":"10.1145/1434878.1434882","DOIUrl":"https://doi.org/10.1145/1434878.1434882","url":null,"abstract":"In attending the numerous technical conventions and symposia that are held each year, we listen to many learned papers. Problems important to our daily work are thoroughly discussed. Generally we return home with ideas that will forward our own engineering investigations. But we often find the problems discussed are larger than the individual or organization can handle. With mounting technical complexity, these problems are more frequently encountered.","PeriodicalId":384732,"journal":{"name":"AIEE-IRE '53 (Eastern)","volume":"2015 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1953-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125642763","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
I should like to discuss two topics which are of some interest. One, is it possible to construct out of elements which are known to be imperfect a logical automaton which will have a given degree of reliability? Two, given a machine, what can one do by way of programming checks to insure accuracy of the final results?
{"title":"Some remarks on logical design and programming checks","authors":"H. Goldstine","doi":"10.1145/1434878.1434900","DOIUrl":"https://doi.org/10.1145/1434878.1434900","url":null,"abstract":"I should like to discuss two topics which are of some interest. One, is it possible to construct out of elements which are known to be imperfect a logical automaton which will have a given degree of reliability? Two, given a machine, what can one do by way of programming checks to insure accuracy of the final results?","PeriodicalId":384732,"journal":{"name":"AIEE-IRE '53 (Eastern)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1953-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132110010","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A digital computer operating in a real-time control system is an information-processing device. Heretofore, special-purpose, general-purpose computers have been designed for use in these systems. This paper begins by considering the basic equation for discrete, linear, real-time control systems. The operations that must be performed are enumerated and described. Several methods for accomplishing each operation are discussed, pointing out the ad-advantages and disadvantages of each method. In conclusion the weighting-function computer is compared with the special-purpose, general-purpose computer and the digital-differential analyzer.
{"title":"Digital computers for linear, real-time control systems","authors":"R. B. Conn","doi":"10.1145/1434878.1434887","DOIUrl":"https://doi.org/10.1145/1434878.1434887","url":null,"abstract":"A digital computer operating in a real-time control system is an information-processing device. Heretofore, special-purpose, general-purpose computers have been designed for use in these systems. This paper begins by considering the basic equation for discrete, linear, real-time control systems. The operations that must be performed are enumerated and described. Several methods for accomplishing each operation are discussed, pointing out the ad-advantages and disadvantages of each method. In conclusion the weighting-function computer is compared with the special-purpose, general-purpose computer and the digital-differential analyzer.","PeriodicalId":384732,"journal":{"name":"AIEE-IRE '53 (Eastern)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1953-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116817721","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
During the past five years the National Bureau of Standards has collaborated with five government agencies in technical programs that involved the performance testing of complete electronic digital-computing systems. Devising a meaningful evaluation procedure proved to be a surprisingly elusive task. Because digital computers are highly integrated assemblies, there is not much value that the prospective user gains from a detailed check on each of the individual facilities and units.
{"title":"Computer performance tests employed by the National Bureau of Standards","authors":"S. N. Alexander, R. D. Elbourn","doi":"10.1145/1434878.1434893","DOIUrl":"https://doi.org/10.1145/1434878.1434893","url":null,"abstract":"During the past five years the National Bureau of Standards has collaborated with five government agencies in technical programs that involved the performance testing of complete electronic digital-computing systems. Devising a meaningful evaluation procedure proved to be a surprisingly elusive task. Because digital computers are highly integrated assemblies, there is not much value that the prospective user gains from a detailed check on each of the individual facilities and units.","PeriodicalId":384732,"journal":{"name":"AIEE-IRE '53 (Eastern)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1953-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115537443","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Since September of 1950, the National Bureau of Standards has had SEAC, a digital-automatic computer, in almost continuous daily usage. It was originally conceived as an interim-computing facility for the use of the government until a more complete computing system could replace it. Consequently, in constructing the machine, it was intended to put into productive operation as soon as possible a minimal machine that could produce computed results. However, the machine proved quite reliable, and the experiments involved in its design were sufficiently successful that SEAC was expanded and kept in operation as a permanent tool at the National Bureau of Standards. It is the purpose of this paper to present some of the operating experience that has been obtained from the use of this computer and to indicate the ways in which component reliability and maintenance procedures have affected the amount of useful computation that has been obtained from SEAC.
自1950年9月以来，美国国家标准局(National Bureau of Standards)几乎每天都在使用数字自动计算机SEAC。它最初被设想为政府使用的临时计算设施，直到一个更完整的计算系统可以取代它。因此，在建造这台机器时，它的目的是使一台能产生计算结果的最小机器尽快投入生产。然而，这台机器被证明是相当可靠的，并且在其设计中涉及的实验非常成功，因此SEAC被扩大并作为国家标准局的永久工具保持运行。本文的目的是介绍从使用这台计算机中获得的一些操作经验，并指出部件可靠性和维护程序如何影响从SEAC获得的有用计算量。
{"title":"SEAC: review of three years of operation","authors":"P. D. Shupe, R. Kirsch","doi":"10.1145/1434878.1434898","DOIUrl":"https://doi.org/10.1145/1434878.1434898","url":null,"abstract":"Since September of 1950, the National Bureau of Standards has had SEAC, a digital-automatic computer, in almost continuous daily usage. It was originally conceived as an interim-computing facility for the use of the government until a more complete computing system could replace it. Consequently, in constructing the machine, it was intended to put into productive operation as soon as possible a minimal machine that could produce computed results. However, the machine proved quite reliable, and the experiments involved in its design were sufficiently successful that SEAC was expanded and kept in operation as a permanent tool at the National Bureau of Standards. It is the purpose of this paper to present some of the operating experience that has been obtained from the use of this computer and to indicate the ways in which component reliability and maintenance procedures have affected the amount of useful computation that has been obtained from SEAC.","PeriodicalId":384732,"journal":{"name":"AIEE-IRE '53 (Eastern)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1953-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132140888","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
It was under the impetus of the last war that several rapid computing devices were developed. They did very difficult and important mathematical work for the government and, in doing so, demonstrated a capacity to handle work similar to that found in many offices. It is not surprising, then, that at the end of the war some of us began to feel that machinery of this kind might be very useful in the life insurance business.
{"title":"The use of electronic data processing systems in the life insurance business","authors":"M. Davis","doi":"10.1145/1434878.1434883","DOIUrl":"https://doi.org/10.1145/1434878.1434883","url":null,"abstract":"It was under the impetus of the last war that several rapid computing devices were developed. They did very difficult and important mathematical work for the government and, in doing so, demonstrated a capacity to handle work similar to that found in many offices. It is not surprising, then, that at the end of the war some of us began to feel that machinery of this kind might be very useful in the life insurance business.","PeriodicalId":384732,"journal":{"name":"AIEE-IRE '53 (Eastern)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1953-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126359143","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Component reliability is a subject that has had the attention, in whole or in part, of almost every electronics symposium or conference the last few years. The failure rate of equipment, claimed to be caused by component failure, warranted this attention. As a result the cry has been for better and better components. This is good. Components should be and are being constantly improved, just as computers and other electronic gear should be constantly improved.
{"title":"Resistor reliability---whose responsibility?: some case histories","authors":"J. Marsten","doi":"10.1145/1434878.1434904","DOIUrl":"https://doi.org/10.1145/1434878.1434904","url":null,"abstract":"Component reliability is a subject that has had the attention, in whole or in part, of almost every electronics symposium or conference the last few years. The failure rate of equipment, claimed to be caused by component failure, warranted this attention. As a result the cry has been for better and better components. This is good. Components should be and are being constantly improved, just as computers and other electronic gear should be constantly improved.","PeriodicalId":384732,"journal":{"name":"AIEE-IRE '53 (Eastern)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1953-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131688517","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
To launch the discussion, the moderator raised the question of the nature of the life characteristic of crystal diodes—whether the number still usable drops off suddenly at some particular life, whether the number falls off steadily with time as an exponential curve, or whether an asymptote is approached, with the remaining diodes appearing to have indefinitely long life. No one quoted carefully-controlled experiments to distinguish among these possibilities, but some opinions favored the last—a relatively long life after an initial period of "weeding out" faulty units. The question was then asked whether tests to a given percentage of the initial back current of a diode would indicate more rapid aging for high-resistance diodes than for low ones. Measurements were quoted which indicate that initially-highback resistance units vary faster than those with lower initial back resistance. There was some discussion of the methods of testing diodes for end of life. Since the resistance characteristic is so nonlinear, one speaker made a plea for measuring and talking about voltages and currents rather than resistances. It also was suggested that ac observations should be made, with oscilloscopic observation, since this gives a rapid check of the shape of the characteristic and shows changes of this shape during the observation period. The need was also mentioned for observing intermittent shorts or opens, particularly under vibration or tapping.
{"title":"Group discussion on crystal diodes","authors":"R. Slutz","doi":"10.1145/1434878.1434909","DOIUrl":"https://doi.org/10.1145/1434878.1434909","url":null,"abstract":"To launch the discussion, the moderator raised the question of the nature of the life characteristic of crystal diodes—whether the number still usable drops off suddenly at some particular life, whether the number falls off steadily with time as an exponential curve, or whether an asymptote is approached, with the remaining diodes appearing to have indefinitely long life. No one quoted carefully-controlled experiments to distinguish among these possibilities, but some opinions favored the last—a relatively long life after an initial period of \"weeding out\" faulty units. The question was then asked whether tests to a given percentage of the initial back current of a diode would indicate more rapid aging for high-resistance diodes than for low ones. Measurements were quoted which indicate that initially-highback resistance units vary faster than those with lower initial back resistance. There was some discussion of the methods of testing diodes for end of life. Since the resistance characteristic is so nonlinear, one speaker made a plea for measuring and talking about voltages and currents rather than resistances. It also was suggested that ac observations should be made, with oscilloscopic observation, since this gives a rapid check of the shape of the characteristic and shows changes of this shape during the observation period. The need was also mentioned for observing intermittent shorts or opens, particularly under vibration or tapping.","PeriodicalId":384732,"journal":{"name":"AIEE-IRE '53 (Eastern)","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1953-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127113043","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
About thirty-five persons attended an informal discussion regarding problems and points of interest pertaining to magnetic tape for use in the computer field. Several engineers explained some of their tape problems and the assembly in general very co-operatively offered helpful suggestions. There was considerable discussion regarding standardization of tape. It is impossible at this early date to set any standards, but various issues were submitted for consideration and these are being presented in this report. Everyone interested is invited to write the chairman regarding any of these subjects or any new items which they would like to discuss. After this information has been exchanged and collated, tentative standards will be formulated and distributed for comment. It is understood that although it will be some time before all the machines in the industry can become standardized, the present discussion may be of help to engineers starting new designs because they will be cognizant of the trend at this time.
{"title":"Group discussion on magnetic-tape standards","authors":"A. Shoup","doi":"10.1145/1434878.1434911","DOIUrl":"https://doi.org/10.1145/1434878.1434911","url":null,"abstract":"About thirty-five persons attended an informal discussion regarding problems and points of interest pertaining to magnetic tape for use in the computer field. Several engineers explained some of their tape problems and the assembly in general very co-operatively offered helpful suggestions. There was considerable discussion regarding standardization of tape. It is impossible at this early date to set any standards, but various issues were submitted for consideration and these are being presented in this report. Everyone interested is invited to write the chairman regarding any of these subjects or any new items which they would like to discuss. After this information has been exchanged and collated, tentative standards will be formulated and distributed for comment. It is understood that although it will be some time before all the machines in the industry can become standardized, the present discussion may be of help to engineers starting new designs because they will be cognizant of the trend at this time.","PeriodicalId":384732,"journal":{"name":"AIEE-IRE '53 (Eastern)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1953-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132509376","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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