Soft dielectric cantilevers with silicon tips for atomic force microscopy applications

P. Janus, R. Dobrowolski, A. Sierakowski, F. Ivaldi, D. Szmigiel, J. Zajac
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Abstract

In this paper authors present design, technology and application of soft silicon dioxide AFM cantilevers. Novel technology allows for manufacturing ultra-soft cantilevers equipped with silicon tip. Mechanical properties of developed probes were tested and finally applied in AFM measurements of fragile samples.
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用于原子力显微镜应用的硅尖端软介电悬臂梁
本文介绍了软性二氧化硅AFM悬臂梁的设计、工艺和应用。新技术允许制造配备硅尖端的超软悬臂。对所研制的探针进行了力学性能测试,并最终应用于脆性样品的AFM测量。
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