{"title":"Experiments and Modeling of a Near-Field Millimeter Wave Vector Microscope","authors":"T. Auriac, J. Raoult","doi":"10.1109/PIERS59004.2023.10221305","DOIUrl":null,"url":null,"abstract":"Near field vector measurement are used from optics to microwaves to identify and image materials and devices on the surface or buried under a thin layer of material. We developed a model of near field interaction between a dipole and a substrate based on our experimental setup of near field millimeter wave vector microscopy. A comparison between the model and the measurement results is presented and discussed.","PeriodicalId":354610,"journal":{"name":"2023 Photonics & Electromagnetics Research Symposium (PIERS)","volume":"179 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 Photonics & Electromagnetics Research Symposium (PIERS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PIERS59004.2023.10221305","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Near field vector measurement are used from optics to microwaves to identify and image materials and devices on the surface or buried under a thin layer of material. We developed a model of near field interaction between a dipole and a substrate based on our experimental setup of near field millimeter wave vector microscopy. A comparison between the model and the measurement results is presented and discussed.
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