Dongil Lee, Byung-Hyun Lee, J. Yoon, Bongsik Choi, Jun-Y. Park, Dae-Chul Ahn, C. Kim, Byeong-Woon Hwang, Seung‐Bae Jeon, Hyun Jun Ahn, Myeong-Lok Seol, Min-Ho Kang, B. Cho, Sung-Jin Choi, Yang‐Kyu Choi
{"title":"First demonstration of a wrap-gated CNT-FET with vertically-suspended channels","authors":"Dongil Lee, Byung-Hyun Lee, J. Yoon, Bongsik Choi, Jun-Y. Park, Dae-Chul Ahn, C. Kim, Byeong-Woon Hwang, Seung‐Bae Jeon, Hyun Jun Ahn, Myeong-Lok Seol, Min-Ho Kang, B. Cho, Sung-Jin Choi, Yang‐Kyu Choi","doi":"10.1109/IEDM.2016.7838351","DOIUrl":null,"url":null,"abstract":"Fully wrap-gated carbon nanotube (CNT) transistors with vertically suspended (VS) semiconducting single-walled CNTs, purified up to 99.9%, are demonstrated for the first time. Without a sacrifice of scalability, remarkably enhanced gate controllability and charge transport capabilities were achieved due to the geometrical advantage of the gate-all-around (GAA) structure with multiple channels. The VS channels were formed with the aid of a silicon-processed vertically integrated nanowire frame, offering high completeness and compatibility with silicon processes. This approach will increase the applicability of CNTs toward high-performance emerging materials.","PeriodicalId":186544,"journal":{"name":"2016 IEEE International Electron Devices Meeting (IEDM)","volume":"95 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Electron Devices Meeting (IEDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2016.7838351","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Fully wrap-gated carbon nanotube (CNT) transistors with vertically suspended (VS) semiconducting single-walled CNTs, purified up to 99.9%, are demonstrated for the first time. Without a sacrifice of scalability, remarkably enhanced gate controllability and charge transport capabilities were achieved due to the geometrical advantage of the gate-all-around (GAA) structure with multiple channels. The VS channels were formed with the aid of a silicon-processed vertically integrated nanowire frame, offering high completeness and compatibility with silicon processes. This approach will increase the applicability of CNTs toward high-performance emerging materials.