{"title":"IEEE-1149.1 use in design for verification and testability at Texas Instruments","authors":"A. Cron","doi":"10.1109/ASIC.1989.123190","DOIUrl":null,"url":null,"abstract":"Products aimed at standardization and cost reduction of IC and system test and debug, compatible with the JTAG/IEEE-1149.1 scan protocols and standards, are discussed. Included are ASIC (application-specific integrated circuit) cells, standard interface ICs, a bus master IC, a controller interface board for IBM compatibles, a high-speed scan interface, and software to control the scan bus. Tradeoffs to be looked at when using the JTAG/IEEE-1149.1 standard for ASIC are evaluated.<<ETX>>","PeriodicalId":245997,"journal":{"name":"Proceedings., Second Annual IEEE ASIC Seminar and Exhibit,","volume":"103 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., Second Annual IEEE ASIC Seminar and Exhibit,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASIC.1989.123190","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
Products aimed at standardization and cost reduction of IC and system test and debug, compatible with the JTAG/IEEE-1149.1 scan protocols and standards, are discussed. Included are ASIC (application-specific integrated circuit) cells, standard interface ICs, a bus master IC, a controller interface board for IBM compatibles, a high-speed scan interface, and software to control the scan bus. Tradeoffs to be looked at when using the JTAG/IEEE-1149.1 standard for ASIC are evaluated.<>
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