{"title":"X-RAY POWDER DIFFRACTION","authors":"","doi":"10.31399/asm.hb.v10.a0001757","DOIUrl":null,"url":null,"abstract":"Rocks, sediments, and precipitates are examples of geologic materials that are composed of minerals. Numerous analytical techniques are used to characterize these materials. One of these methods, X-ray powder diffraction (XRD), is an instrumental technique that is used to identify minerals, as well as other crystalline materials. In many geologic investigations, XRD complements other mineralogical methods, including optical light microscopy, electron microprobe microscopy, and scanning electron microscopy. XRD provides the researcher with a fast and reliable tool for routine mineral identification. XRD is particularly useful for identifying finegrained minerals and mixtures or intergrowths of minerals that may not lend themselves to analysis by other techniques. XRD can provide additional information beyond basic identification. If the sample is a mixture, XRD data can be analyzed to determine the proportion of the different minerals present. Other information obtained can include the degree of crystallinity of the mineral(s) present, possible deviations of the minerals from their ideal compositions (presence of element substitutions and solid solutions), the structural state of the minerals (which can be used to deduce temperatures and (or) pressures of formation), and the degree of hydration for minerals that contain water in their structure. Some mineralogical samples analyzed by XRD are too fine grained to be identified by optical light microscopy. XRD does not, however, provide the quantitative compositional data obtained by the electron microprobe or me textural and qualitative compositional data obtained by the scanning electron microscope. Theory and Methodology","PeriodicalId":385691,"journal":{"name":"Anales de Química","volume":"1103 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"71","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Anales de Química","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.hb.v10.a0001757","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 71
Abstract
Rocks, sediments, and precipitates are examples of geologic materials that are composed of minerals. Numerous analytical techniques are used to characterize these materials. One of these methods, X-ray powder diffraction (XRD), is an instrumental technique that is used to identify minerals, as well as other crystalline materials. In many geologic investigations, XRD complements other mineralogical methods, including optical light microscopy, electron microprobe microscopy, and scanning electron microscopy. XRD provides the researcher with a fast and reliable tool for routine mineral identification. XRD is particularly useful for identifying finegrained minerals and mixtures or intergrowths of minerals that may not lend themselves to analysis by other techniques. XRD can provide additional information beyond basic identification. If the sample is a mixture, XRD data can be analyzed to determine the proportion of the different minerals present. Other information obtained can include the degree of crystallinity of the mineral(s) present, possible deviations of the minerals from their ideal compositions (presence of element substitutions and solid solutions), the structural state of the minerals (which can be used to deduce temperatures and (or) pressures of formation), and the degree of hydration for minerals that contain water in their structure. Some mineralogical samples analyzed by XRD are too fine grained to be identified by optical light microscopy. XRD does not, however, provide the quantitative compositional data obtained by the electron microprobe or me textural and qualitative compositional data obtained by the scanning electron microscope. Theory and Methodology