{"title":"Can We Use EDS to Determine Fluorine Contamination Level on A Normal Al Bondpad?","authors":"H. Younan","doi":"10.1109/IPFA.2018.8452520","DOIUrl":null,"url":null,"abstract":"IN this paper, the differences between EDS and AES are discussed. One can full understand what limitation of EDS technique is and why AES is better tool to determine F contamination on a normal Al bondpad. During application we cannot directly compare EDS result to AES result as EDS is a bulk analysis technique, while AES is surface analysis technique. For surface contamination analysis, a practice rule should be followed: “EDS clean is not clean” and “Auger clean is clean”. It is fully recommended for us to use AES to analyse and monitor surface F contamination level on a normal Al bondpad.","PeriodicalId":382811,"journal":{"name":"2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","volume":"115 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2018.8452520","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
IN this paper, the differences between EDS and AES are discussed. One can full understand what limitation of EDS technique is and why AES is better tool to determine F contamination on a normal Al bondpad. During application we cannot directly compare EDS result to AES result as EDS is a bulk analysis technique, while AES is surface analysis technique. For surface contamination analysis, a practice rule should be followed: “EDS clean is not clean” and “Auger clean is clean”. It is fully recommended for us to use AES to analyse and monitor surface F contamination level on a normal Al bondpad.