A new low energy BIST using a statistical code

Abstract

To tackle with the increased switching activity during the test operation, this paper proposes a new built-in self test (BIST) scheme for low energy testing that uses a statistical code and a new technique to skip unnecessary test sequences. From a general point of view, the goal of this technique is to minimize the total power consumption during a test and to allow the at-speed test in order to achieve high fault coverage. The effectiveness of the proposed low energy BIST scheme was validated on a set of ISC AS '89 benchmark circuits with respect to test data volume and energy saving.