{"title":"Field-of-view extension and XY-drift correction in microscopy for large samples","authors":"Alejandro Silva, M. Arocena, J. Alonso","doi":"10.1364/cosi.2022.ctu4f.6","DOIUrl":null,"url":null,"abstract":"We propose a method for sample XY-drift correction by means of feature detection and correlation analysis along with field-of-view extension for large sample images taken through a microscope with a motorized XY stage","PeriodicalId":286361,"journal":{"name":"Imaging and Applied Optics Congress 2022 (3D, AOA, COSI, ISA, pcAOP)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Imaging and Applied Optics Congress 2022 (3D, AOA, COSI, ISA, pcAOP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/cosi.2022.ctu4f.6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
We propose a method for sample XY-drift correction by means of feature detection and correlation analysis along with field-of-view extension for large sample images taken through a microscope with a motorized XY stage
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