{"title":"EFFECT OF SPACE SPACE FACTORS ON CMOS TECHNOLOGY CHIP","authors":"I. Zhuravleva","doi":"10.34220/mamsp_209-213","DOIUrl":null,"url":null,"abstract":"The resistance of the IC to all kinds of radiation is established by various types of integrated circuits with a characteristic structure, the criteria of which are allowed to record single or multiple transformations. The article considers that a significant influence on the suitability of microcircuits in the situation of exposure to ionizing radiation is manifested not by spatial phenomena in silicon, but by surface effects related to the silicon-dielectric distribution line.","PeriodicalId":113054,"journal":{"name":"Materials of the All-Russian Scientific and Practical Conference \"Modern aspects of modeling systems and processes\"","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Materials of the All-Russian Scientific and Practical Conference \"Modern aspects of modeling systems and processes\"","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.34220/mamsp_209-213","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The resistance of the IC to all kinds of radiation is established by various types of integrated circuits with a characteristic structure, the criteria of which are allowed to record single or multiple transformations. The article considers that a significant influence on the suitability of microcircuits in the situation of exposure to ionizing radiation is manifested not by spatial phenomena in silicon, but by surface effects related to the silicon-dielectric distribution line.
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