W. Hortschitz, A. Kainz, G. Kovács, H. Steiner, M. Stifter, T. Sauter, J. Schalko, A. Jachimowicz, F. Keplinger
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引用次数: 3
Abstract
High performance applications such as the detection of seismic activity or structural health monitoring require sensors with low resonance frequencies. For micro-electro-mechanical-system (MEMS) accelero-meters and vibration sensors it is crucial to lower the resonance frequency in order to increase its sensitivity or bandwidth. In contrast to commercial devices which exhibit resonance frequencies of more than 500 Hz, we present extremely sensitive, optically read-out devices with resonances down to 45 Hz. This low resonance frequency was mainly achieved by fabricating the complete seismic mass from one single crystal silicon block. Compared to previously reported work the resonance frequency could be lowered from over 940 Hz down to 45 Hz while the resolution was massively increased from 7.6 μg/sqrt(Hz) to 1.17 μg/sqrt(Hz) (@4 Hz).
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