M. Shibamoto, K. Yamanaka, D. Djayaprawira, N. Watanabe
{"title":"Effect of NiCr and NiFeCr seedlayer on magnetic properties and crystallography of CoCrPt-SiO/sub 2/ perpendicular recording media","authors":"M. Shibamoto, K. Yamanaka, D. Djayaprawira, N. Watanabe","doi":"10.1109/INTMAG.2005.1463720","DOIUrl":null,"url":null,"abstract":"There have been intensive research activities on perpendicular magnetic recording media using CoCrPt-SiO/sub 2/ material as the recording layer. To obtain a relatively high coercivity and good crystallography relatively thick Ru thickness is necessary. In this paper, we studied the effect if NiCr and NiFeCr seedlayer on the magnetic properties and crystallography of CoCrPt-SiO/sub 2/ PMR media using vibrating sample magnetometer and X-ray diffractometry (XRD). The PMR media were deposited by sputtering on a glass substrate.","PeriodicalId":273174,"journal":{"name":"INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005.","volume":"187 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-04-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INTMAG.2005.1463720","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
There have been intensive research activities on perpendicular magnetic recording media using CoCrPt-SiO/sub 2/ material as the recording layer. To obtain a relatively high coercivity and good crystallography relatively thick Ru thickness is necessary. In this paper, we studied the effect if NiCr and NiFeCr seedlayer on the magnetic properties and crystallography of CoCrPt-SiO/sub 2/ PMR media using vibrating sample magnetometer and X-ray diffractometry (XRD). The PMR media were deposited by sputtering on a glass substrate.
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