{"title":"1/f bulk phenomena noise theory for GaAs MESFETs","authors":"K. T. Yan, L. Forbes","doi":"10.1109/TENCON.1995.496349","DOIUrl":null,"url":null,"abstract":"A 1/f noise model based on the distributed equivalent circuit technique for evaluating the semi-insulating substrate is proposed. Our model shows that the 1/f noise is a bulk phenomena with localized high frequency variations and long range low frequency fluctuations with the lowest frequency being constrained by the thickness of the material.","PeriodicalId":425138,"journal":{"name":"1995 IEEE TENCON. IEEE Region 10 International Conference on Microelectronics and VLSI. 'Asia-Pacific Microelectronics 2000'. Proceedings","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1995 IEEE TENCON. IEEE Region 10 International Conference on Microelectronics and VLSI. 'Asia-Pacific Microelectronics 2000'. Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TENCON.1995.496349","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
A 1/f noise model based on the distributed equivalent circuit technique for evaluating the semi-insulating substrate is proposed. Our model shows that the 1/f noise is a bulk phenomena with localized high frequency variations and long range low frequency fluctuations with the lowest frequency being constrained by the thickness of the material.
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