New FIDES models for emerging technologies

Abstract

The purpose of this paper is to describe the PISTIS project, mainly focused on the reliability of emerging technologies involved in electronic systems. PISTIS is a French acronym, meaning faith, trust and confidence, from the Greek origin. Managing the reliability risk is a big challenge in rugged environments. PISTIS is linked to FIDES, a guide allowing reliability prediction of electronic systems. Results from in-service study presented in this paper show the accordance between FIDES predictions and reliability observed. This confirmed the interest to complete FIDES models by taking into account intrinsic wear-out effects limiting the operating lifetime. The PISTIS project started in 2015. Depending on the technologies and their main failure mechanisms, different long-term test processes are set up to evaluate the wear-out effects. To be able to construct reliability prediction models taking into account these effects, the stress level of reliability tests need to be close to the actual extreme use conditions and mission profiles in which electronic equipment are used.