Thickness measurement of multi-layered structures using SD-OCT Imaging System

Abstract

We present the method to measure the thickness of multi-layered structure using an indigenously developed SD-OCT system. The SD-OCT system is based on low coherence Michelson interferometry and generates 2D images(B-Scan) with axial resolution of 5 microns. The method developed processes these 2D images in MATLAB and yields information on thickness of each underlying layer in terms of pixels. Samples such as scotch tape and cover slip with known thickness have been used to validate this method. The thickness results obtained using the developed algorithm are in good correlation with the actual physical values within very tight tolerance. This method can be applied to determine thickness of outer paint of aircraft, thickness of fruits, leaves and stems in fruits agro sector besides many other applications.