An automatic netlist and floorplanning approach to improve the MTTR of scrubbing techniques (abstract only)

Bernhard Schmidt, Daniel Ziener, J. Teich
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引用次数: 1

Abstract

We introduce a new SEU mitigation approach which minimizes the scrubbing effort by a) using an automatic classification of the criticality of netlist instances and their resulting configuration bits, and by b) minimizing the number of frames which must be scrubbed by using intelligent floorplanning. The criticality of configuration bits is defined by the actions needed to correct a radiation-induced SEU at this bit. Indeed, circuits that involve feedback loops might still and infinitely cause a malfunction even if scrubbing is applied to involved configuration frames. Here, only supplementary state-restoring might be a viable solution. By analyzing an FPGA design already at the logic level and partition configuration bits of the resulting FPGA mapping into so-called essential bits and critical bits, we are able to significantly reduce the number of time consuming state-restoring actions. Moreover, by using placement and routing constraints, it is shown how to minimize the number of frames which have to be reconfigured or checked when using scrubbing. By applying both methods, we will show a reduction of the Mean-Time-To-Repair (MTTR) for sequential benchmark circuits by up to 48.5% compared to a state-of-the-art approach.
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一种自动网表和地板规划方法来提高擦洗技术的MTTR(仅摘要)
我们引入了一种新的SEU缓解方法,通过a)使用对网表实例的临界性及其产生的配置位的自动分类,以及b)通过使用智能地板规划最小化必须擦洗的帧数,从而最大限度地减少擦洗工作。配置位的关键程度取决于在该位纠正辐射诱发的SEU所需的措施。实际上,包含反馈回路的电路,即使对所涉及的配置帧应用了擦洗,仍然可能无限地引起故障。在这里,只有补充状态恢复可能是一个可行的解决方案。通过分析已经在逻辑级别的FPGA设计,并将结果FPGA的配置位划分为所谓的基本位和关键位,我们能够显着减少耗时的状态恢复操作的数量。此外,通过使用位置和路由约束,展示了如何在使用擦洗时最小化必须重新配置或检查的帧的数量。通过应用这两种方法,我们将显示,与最先进的方法相比,顺序基准电路的平均维修时间(MTTR)减少了48.5%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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