W2W wafer level vacuum packaging of MEMS devices using solder

Honglin Zhang, B. An, Chenxu Niu
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Abstract

With the increasing integration of mechanical and electronic components on the MEMS cavity, the complexity of the system enhances exponentially and thus leads to a need for the larger size package and good process compatibility. Wafer-level vacuum packaging (WLVP) is a promising direction, in this work, Wafer-to-Wafer (W2W) vacuum bonding for MEMS devices by solder sealing were investigated. The wafers with a solder seal ring array on were prepared and W2W bonding was processed in a vacuum bonding system. Then the package units were diced and tested. The shear strength and hermetic test results showed that the vacuum into the samples met the requirements of MIL-STD-883. For further, the relation between the width of the solder ring and the pressure-bearing ability of the device was investigated so as to balance the reliability and size of the MEMS devices.
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W2W晶圆级真空封装MEMS器件采用焊料
随着机械和电子元件在MEMS腔体上的集成度不断提高,系统的复杂性呈指数级增长,因此需要更大尺寸的封装和良好的工艺兼容性。晶圆级真空封装(WLVP)是一个很有前途的发展方向,本文研究了MEMS器件的晶圆间真空封装(W2W)。制备了带焊料密封圈阵列的硅片,并在真空焊接系统中进行了W2W焊接。然后将包装单元切成小块并进行测试。剪切强度和密封性试验结果表明,真空注入试样符合MIL-STD-883的要求。进一步研究了焊环宽度与器件承压能力的关系,以平衡MEMS器件的可靠性和尺寸。
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