{"title":"Integrated circuit (IC) aging effects on radio-frequency distinct native attributes (RF-DNA)","authors":"Randall D. Deppensmith, Samuel J. Stone","doi":"10.1109/NAECON.2014.7045830","DOIUrl":null,"url":null,"abstract":"Device discrimination using RF-DNA utilizes the uniqueness resulting from integrated circuit (IC) manufacturing process variation. As an IC ages toward wear-out failure, internal physical alterations may impart additional changes on the order of initial process variations. This paper proposes exploration of: 1) the impact of aging on RF-DNA discrimination reliability, and 2) a means to monitor IC aging using RF-DNA.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NAECON.2014.7045830","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Device discrimination using RF-DNA utilizes the uniqueness resulting from integrated circuit (IC) manufacturing process variation. As an IC ages toward wear-out failure, internal physical alterations may impart additional changes on the order of initial process variations. This paper proposes exploration of: 1) the impact of aging on RF-DNA discrimination reliability, and 2) a means to monitor IC aging using RF-DNA.
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