A. Chu, H. Cronson, J. Devine, S. Soares, M.N. Soloman, H. Lezec, C. Musil
{"title":"RE built-in test and enabling technologies for integrated diagnostics","authors":"A. Chu, H. Cronson, J. Devine, S. Soares, M.N. Soloman, H. Lezec, C. Musil","doi":"10.1109/AUTEST.1992.270112","DOIUrl":null,"url":null,"abstract":"The authors describe a vision of unambiguous fault isolation on RF equipment and enabling critical technologies. The overall goal is reduction of logistic support and maintenance cost of RF subsystems. Savings will be achieved through reduced false alarms, troubleshooting, false removal rates, spares inventory, and support equipment. The authors describe technology developments in miniature sources and signal analyzers with examples of built-in test (BIT) implementations utilizing specifically designed monolithic microwave integrated circuits (MMICs). These emerging technologies applied to integrated diagnostics can result in substantial cost avoidance in maintenance, spares inventory, and support equipment.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1992.270112","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
The authors describe a vision of unambiguous fault isolation on RF equipment and enabling critical technologies. The overall goal is reduction of logistic support and maintenance cost of RF subsystems. Savings will be achieved through reduced false alarms, troubleshooting, false removal rates, spares inventory, and support equipment. The authors describe technology developments in miniature sources and signal analyzers with examples of built-in test (BIT) implementations utilizing specifically designed monolithic microwave integrated circuits (MMICs). These emerging technologies applied to integrated diagnostics can result in substantial cost avoidance in maintenance, spares inventory, and support equipment.<>
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