Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270116
R. Sallade
The author describes the use of diagnostic techniques in the design, testing, and maintenance of software. The goal in applying diagnostic techniques to software is twofold. First, design-for-test techniques can be applied to help ensure that software failures can be diagnosed when they occur. Second, testing software using techniques which are normally applied to the testing of diagnostics can help detect and eliminate software failures before the product is delivered. This means that the diagnostic design techniques are applied to make the software more testable, and that the software is tested more thoroughly using methods which are applied to testing of diagnostic capabilities.<>
{"title":"Applying diagnostic techniques to improve software quality","authors":"R. Sallade","doi":"10.1109/AUTEST.1992.270116","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270116","url":null,"abstract":"The author describes the use of diagnostic techniques in the design, testing, and maintenance of software. The goal in applying diagnostic techniques to software is twofold. First, design-for-test techniques can be applied to help ensure that software failures can be diagnosed when they occur. Second, testing software using techniques which are normally applied to the testing of diagnostics can help detect and eliminate software failures before the product is delivered. This means that the diagnostic design techniques are applied to make the software more testable, and that the software is tested more thoroughly using methods which are applied to testing of diagnostic capabilities.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114677286","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270118
J. Sheppard
The author discusses an approach to identifying and correcting errors in diagnostic models using explanation based learning. The approach uses a model of the system to be diagnosed that may have missing information about the relationships between tests and possible diagnoses. In particular, he uses a structural model or information flow model to guide diagnosis. When misdiagnosis occurs, the model is used to determine how to search for the actual fault through additional testing. When the fault is identified, an explanation is constructed from the original misdiagnosis and the model is modified to compensate for the incorrect behavior of the system.<>
{"title":"Explanation-based learning with diagnostic models","authors":"J. Sheppard","doi":"10.1109/AUTEST.1992.270118","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270118","url":null,"abstract":"The author discusses an approach to identifying and correcting errors in diagnostic models using explanation based learning. The approach uses a model of the system to be diagnosed that may have missing information about the relationships between tests and possible diagnoses. In particular, he uses a structural model or information flow model to guide diagnosis. When misdiagnosis occurs, the model is used to determine how to search for the actual fault through additional testing. When the fault is identified, an explanation is constructed from the original misdiagnosis and the model is modified to compensate for the incorrect behavior of the system.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129023365","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270139
W.E. Russell
The author presents the technical details of the US Air Force Manufacturing Technology PDES Application Protocols for Electronics (PAP-E) program. The PAP-E program relates to the ATLAS/Ada based environment for test (ABET) architecture under development. This program is developing the Product Data Exchange using STEP (standard for the exchange of product model data) (PDES/STEP) application protocols, to be presented to the International Electrotechnical Committee (IEC) and International Organization for Standardization (ISO) STEP standards community. The application protocols to be developed by this program are for the representation of printed circuit assembly and line replaceable module test, diagnostics, and re-engineering life cycle support product data. In addition to the PDES/STEP standards focus, product data requirements in the form of information models are being provided to existing electronics product data standards bodies such as the IEEE, EIA, and CAD Framework Initiative, Inc. (CFI).<>
{"title":"Product data for life cycle support","authors":"W.E. Russell","doi":"10.1109/AUTEST.1992.270139","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270139","url":null,"abstract":"The author presents the technical details of the US Air Force Manufacturing Technology PDES Application Protocols for Electronics (PAP-E) program. The PAP-E program relates to the ATLAS/Ada based environment for test (ABET) architecture under development. This program is developing the Product Data Exchange using STEP (standard for the exchange of product model data) (PDES/STEP) application protocols, to be presented to the International Electrotechnical Committee (IEC) and International Organization for Standardization (ISO) STEP standards community. The application protocols to be developed by this program are for the representation of printed circuit assembly and line replaceable module test, diagnostics, and re-engineering life cycle support product data. In addition to the PDES/STEP standards focus, product data requirements in the form of information models are being provided to existing electronics product data standards bodies such as the IEEE, EIA, and CAD Framework Initiative, Inc. (CFI).<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129075722","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270085
R. A. Nicholson
Vertical test equipment commonality implemented in support of two level maintenance for the Army TACMS missile led to a concurrently engineered development program. The customer prime contractor and subcontractors united as a team in pursuing an integrated concurrent design. The author concentrates more on the factors that govern the integrated design rather than on the design itself. A brief description of the system and then a little more detail on the influence of commonality on design approach, concept, and requirements serve as a backdrop for a discussion on personnel interaction and lessons learned. The expected benefits of lower test equipment costs, improved quality, and mature organic depot support at initial operational capability (IOC) were all realized. The experience on this program suggests that concurrent engineering should be implemented from the viewpoint of specifying system requirements that force the process.<>
{"title":"Vertical commonality is successful for the Army TACMS missile","authors":"R. A. Nicholson","doi":"10.1109/AUTEST.1992.270085","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270085","url":null,"abstract":"Vertical test equipment commonality implemented in support of two level maintenance for the Army TACMS missile led to a concurrently engineered development program. The customer prime contractor and subcontractors united as a team in pursuing an integrated concurrent design. The author concentrates more on the factors that govern the integrated design rather than on the design itself. A brief description of the system and then a little more detail on the influence of commonality on design approach, concept, and requirements serve as a backdrop for a discussion on personnel interaction and lessons learned. The expected benefits of lower test equipment costs, improved quality, and mature organic depot support at initial operational capability (IOC) were all realized. The experience on this program suggests that concurrent engineering should be implemented from the viewpoint of specifying system requirements that force the process.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127603275","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270136
R. Williams
Summary form only given. Hewlett-Packard Company has developed a number of tools that assist the manufacturers of commercial vehicles to dramatically increase their productivity in three critical areas: software development time, technical information storage and retrieval, and vehicle diagnostics. These tools are described. The use by the military of commercial tools in these areas will dramatically reduce costs and increase reliability and uptime.<>
{"title":"Commercial vehicle software development, diagnostics and information retrieval","authors":"R. Williams","doi":"10.1109/AUTEST.1992.270136","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270136","url":null,"abstract":"Summary form only given. Hewlett-Packard Company has developed a number of tools that assist the manufacturers of commercial vehicles to dramatically increase their productivity in three critical areas: software development time, technical information storage and retrieval, and vehicle diagnostics. These tools are described. The use by the military of commercial tools in these areas will dramatically reduce costs and increase reliability and uptime.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"239 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132393465","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270130
J.F. Davis, A. W. Goodaker, J. K. McDowell, M. AbdAllah
A knowledge-based approach for diagnosis of electronic circuits in avionics systems is discussed. The knowledge-based methodology is generic and was designed for accurate and efficient identification of malfunctioning circuit components in diagnostic situations involving single-component malfunctions, multiple independent malfunctions, and multiple interacting malfunctions. The resulting methodology integrates the features of two knowledge-based techniques. Hierarchical classification (HC), a compiled knowledge approach, is used to efficiently identify single and multiple malfunctions. An approach called diagnostically focused simulation, which refines the HC results with causal reasoning, is then used to resolve whether multiple malfunctions are the result of independent component failures or whether an interaction exists that relates the malfunction behaviors. A generally-applicable shell incorporating the methodology was developed in a commercial software package and applied to the development of a diagnostic system for a black and white television circuit.<>
{"title":"Knowledge-based diagnostic systems for avionics","authors":"J.F. Davis, A. W. Goodaker, J. K. McDowell, M. AbdAllah","doi":"10.1109/AUTEST.1992.270130","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270130","url":null,"abstract":"A knowledge-based approach for diagnosis of electronic circuits in avionics systems is discussed. The knowledge-based methodology is generic and was designed for accurate and efficient identification of malfunctioning circuit components in diagnostic situations involving single-component malfunctions, multiple independent malfunctions, and multiple interacting malfunctions. The resulting methodology integrates the features of two knowledge-based techniques. Hierarchical classification (HC), a compiled knowledge approach, is used to efficiently identify single and multiple malfunctions. An approach called diagnostically focused simulation, which refines the HC results with causal reasoning, is then used to resolve whether multiple malfunctions are the result of independent component failures or whether an interaction exists that relates the malfunction behaviors. A generally-applicable shell incorporating the methodology was developed in a commercial software package and applied to the development of a diagnostic system for a black and white television circuit.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130280754","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270141
C. V. Conway
The author describes the process of creating a demonstration of online, paperless manuals, created from existing paper technical orders, and embedding them in automated testing equipment (ATE). The demonstration showed the ability to embed interactive electronic technical manuals (IETMs) in an ATE to allow technicians to keep them open for reference, while primarily monitoring test program set (TPS) execution, and to switch between TPS monitoring and the IETM when necessary to get additional information.<>
{"title":"An on-line paperless manual integrated with TPS execution","authors":"C. V. Conway","doi":"10.1109/AUTEST.1992.270141","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270141","url":null,"abstract":"The author describes the process of creating a demonstration of online, paperless manuals, created from existing paper technical orders, and embedding them in automated testing equipment (ATE). The demonstration showed the ability to embed interactive electronic technical manuals (IETMs) in an ATE to allow technicians to keep them open for reference, while primarily monitoring test program set (TPS) execution, and to switch between TPS monitoring and the IETM when necessary to get additional information.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128561553","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270128
D.B. Stinson
The author discusses the application of tasking in Ada test programs to satisfy multithreaded dynamic functional testing requirements. Ada's inherent multitasking capability, which can express both control and data dependencies among simultaneous actions, is one of the reasons why the IEEE ATLAS Committee (SCC 20) is presently engaged in developing a new Ada-based test program specification standard, designated informally as ABET/ATLAS. Experience using ATLAS tasking can be applied in the development of the ABET standards and in the implementation of Ada test programs. The author cites instances where multitasking is and is not appropriate and suggests some guidelines for implementing multithreaded Ada test programs developed in conformance with ABET/ATLAS.<>
{"title":"Implementing multi-threaded test methods with ABET/ATLAS","authors":"D.B. Stinson","doi":"10.1109/AUTEST.1992.270128","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270128","url":null,"abstract":"The author discusses the application of tasking in Ada test programs to satisfy multithreaded dynamic functional testing requirements. Ada's inherent multitasking capability, which can express both control and data dependencies among simultaneous actions, is one of the reasons why the IEEE ATLAS Committee (SCC 20) is presently engaged in developing a new Ada-based test program specification standard, designated informally as ABET/ATLAS. Experience using ATLAS tasking can be applied in the development of the ABET standards and in the implementation of Ada test programs. The author cites instances where multitasking is and is not appropriate and suggests some guidelines for implementing multithreaded Ada test programs developed in conformance with ABET/ATLAS.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125383433","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270101
W. Fordyce
A comprehensive maintenance system was developed for the over-the-horizon backscatter (OTH-B) radar modular automatic test equipment (MATE). Particular emphasis was placed on developing the maintenance software for the critical MATE RF augmentation system. The author describes the design approach as well as lessons learned in developing a fully compliant MATE maintenance software system. System maintenance was performed through a combination of continuous status monitoring, rapid internal instrument self-test, and a comprehensive ATLAS self-test. A unique 11-min internal self-test program for the RF augmentation not only checks critical instrument functionality, but also checks critical RF switches, routing, and interface parameters. This multitier maintenance approach provides rapid critical fault detection along with accurate fault isolation to a single assembly/subassembly.<>
{"title":"A maintenance system for the OTH-B MATE with RF augmentation","authors":"W. Fordyce","doi":"10.1109/AUTEST.1992.270101","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270101","url":null,"abstract":"A comprehensive maintenance system was developed for the over-the-horizon backscatter (OTH-B) radar modular automatic test equipment (MATE). Particular emphasis was placed on developing the maintenance software for the critical MATE RF augmentation system. The author describes the design approach as well as lessons learned in developing a fully compliant MATE maintenance software system. System maintenance was performed through a combination of continuous status monitoring, rapid internal instrument self-test, and a comprehensive ATLAS self-test. A unique 11-min internal self-test program for the RF augmentation not only checks critical instrument functionality, but also checks critical RF switches, routing, and interface parameters. This multitier maintenance approach provides rapid critical fault detection along with accurate fault isolation to a single assembly/subassembly.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126091947","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270119
J. Sheppard, W. Simpson
The authors describe an approach to associating temporal knowledge with a diagnostic system. They present a summary of work done in developing an algebra of relations for temporal reasoning, and proceed to extend the work using an interval based approach, but incorporating point intervals in the model. A propositional calculus representation of the temporal relations is derived and combined with the transitive closure algorithm that operates on a bit matrix. The result is an efficient and relatively simple approach to modeling relations between temporal intervals and propagating the constraints imposed by these relations through the knowledge base.<>
{"title":"Fault diagnosis under temporal constraints","authors":"J. Sheppard, W. Simpson","doi":"10.1109/AUTEST.1992.270119","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270119","url":null,"abstract":"The authors describe an approach to associating temporal knowledge with a diagnostic system. They present a summary of work done in developing an algebra of relations for temporal reasoning, and proceed to extend the work using an interval based approach, but incorporating point intervals in the model. A propositional calculus representation of the temporal relations is derived and combined with the transitive closure algorithm that operates on a bit matrix. The result is an efficient and relatively simple approach to modeling relations between temporal intervals and propagating the constraints imposed by these relations through the knowledge base.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126691898","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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