{"title":"Optical sensing opportunities in production MBE","authors":"K. Evans, S. Roth","doi":"10.1109/LEOSST.2000.869718","DOIUrl":null,"url":null,"abstract":"Optical sensing has the potential to enable significant cost reduction and/or quality enhancement via: (1) the ability to impact wafer yield (number of wafers meeting customers spec divided by the total number of wafers grown), and (2) wafer throughput (rate of producing wafers that meet customer spec). Improvements in yield and throughput generally positively impact delivery times as well. Key technological and capacity issues that directly impact MBE process yield and throughput and for which optical sensors could play a role are discussed.","PeriodicalId":415720,"journal":{"name":"2000 Digest of the LEOS Summer Topical Meetings. Electronic-Enhanced Optics. Optical Sensing in Semiconductor Manufacturing. Electro-Optics in Space. Broadband Optical Networks (Cat. No.00TH8497)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 Digest of the LEOS Summer Topical Meetings. Electronic-Enhanced Optics. Optical Sensing in Semiconductor Manufacturing. Electro-Optics in Space. Broadband Optical Networks (Cat. No.00TH8497)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LEOSST.2000.869718","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Optical sensing has the potential to enable significant cost reduction and/or quality enhancement via: (1) the ability to impact wafer yield (number of wafers meeting customers spec divided by the total number of wafers grown), and (2) wafer throughput (rate of producing wafers that meet customer spec). Improvements in yield and throughput generally positively impact delivery times as well. Key technological and capacity issues that directly impact MBE process yield and throughput and for which optical sensors could play a role are discussed.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
光学传感在MBE生产中的机会
光学传感有可能通过以下方式显著降低成本和/或提高质量:(1)影响晶圆产量的能力(符合客户规格的晶圆数量除以生长的晶圆总数),以及(2)晶圆吞吐量(生产符合客户规格的晶圆的速度)。产量和产量的提高通常也会对交货时间产生积极影响。讨论了直接影响MBE工艺良率和吞吐量的关键技术和容量问题,以及光学传感器可以发挥作用的问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
All optical regeneration Simple and low-cost silicon Fabry-Perot filter for WDM channel monitoring Optical comparator based on FLC LCOS technology Performance of radio-over-fibre broadband access in the presence of interferometric noise Alignment tolerant hybrid photoreceivers using inverted MSMs
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1