V. Radhakrishnan, N. Achutan, S. Verghese, R. Santoshkumar
{"title":"A new approach to the measurement of surface roughness using the pulse-jet capacitance method","authors":"V. Radhakrishnan, N. Achutan, S. Verghese, R. Santoshkumar","doi":"10.1109/ETD.1995.403509","DOIUrl":null,"url":null,"abstract":"In-process monitoring of surface roughness has assumed considerable significance in present day manufacturing due to reduced tolerances and better understanding of the functional behaviour of surfaces. The paper deals with the pulse jet capacitance system for noncontact sensing of the surface finish. It concentrates on the prototype development and testing for this state of the art technique useful for research or industrial applications.<<ETX>>","PeriodicalId":302763,"journal":{"name":"Proceedings Electronic Technology Directions to the Year 2000","volume":"121 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Electronic Technology Directions to the Year 2000","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETD.1995.403509","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In-process monitoring of surface roughness has assumed considerable significance in present day manufacturing due to reduced tolerances and better understanding of the functional behaviour of surfaces. The paper deals with the pulse jet capacitance system for noncontact sensing of the surface finish. It concentrates on the prototype development and testing for this state of the art technique useful for research or industrial applications.<>
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