Reliability Simulation and Analysis of Important RF Circuits Using Cadence Relxpert

Abstract

Reliability studies have conventionally been limited to process qualification and as an input to design guides that come with the PDKs. However, Reliability concerns have increased in the present state-of-the-art chip designs due to scaling, new materials and devices, more demanding mission profiles, and increasing constraints of time and money. RelXpert is a tool developed by Cadence to simulate MOSFET devices for device degradation due to various reliability mechanisms like HCI, NBTWBTI, etc. In this study, we have analyzed key building blocks used in RF receiver front-end such as Cascode and Folded-Cascode LNA amplifiers, Cross-coupled LC VCO and Mixer using Cadence RelXpert and GLOBALFOUNDRIES 45nm RFSOI PDK models. The simulations were run for 10-year EOL (End Of Life) criteria. Also, some insights have been presented to make designs more robust. The model equations used are based on energy driven model for HCI. In addition, there is a standard NBTI model with relaxation effects modeled for AC stress.