Utilization of target diffraction to measure a high electromagnetic field

S. Vauchamp, M. Lalande, J. Andrieu, B. Jecko, J. Lasserre, A. Paupert, G. Teyssidou, R. Pouzalgues
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引用次数: 3

Abstract

XLIM, French research institute based at the University of Limoges, develops a patented project which is called "Michelson project". The objective of this study is to measure a high electromagnetic field in a selected location by using the diffraction of a target. To realize this measurement, a target, a receiving antenna and a system of acquisition are needed. This method allows to measure high electromagnetic field without risk of receiving antenna breakdown, and disturbs less the field in the zone of the measurement, because no cables are used and the dimensions of the target are small. According to the source and so according to the chosen receiving antenna, the Michelson method can measure as well harmonic signals as transient signals.
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利用靶衍射测量高电磁场
位于利摩日大学的法国研究机构XLIM开发了一个名为“迈克尔逊项目”的专利项目。本研究的目的是利用目标的衍射来测量选定位置的高电磁场。为了实现这种测量,需要一个目标、一个接收天线和一个采集系统。这种方法允许测量高电磁场而没有接收天线击穿的风险,并且由于不使用电缆和目标尺寸小,对测量区域内的场干扰较小。根据源和接收天线的选择,迈克尔逊方法既可以测量谐波信号,也可以测量瞬态信号。
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