Open architecture test system: not why but when!

Abstract

Due to rapidly escalating semiconductor manufacturing test costs, leading consumers (chip manufacturers) are urging the ATE industry to identify new test systems and business models that can significantly lower test costs. We examine the shifting consumer needs and identify attributes of a test system that can effectively meet the requirements of the consumer. Open test systems have the potential to reduce test costs, but they also result in seismic changes in the ATE industry. We discuss the effect of these changes on consumers, incumbent ATE vendors and new entrants. We conclude that benefits of open test systems are now visible within leading ATE vendors, but an industry-wide open test system is necessary to realize meaningful cost reductions for the semiconductor chip manufacturer.