Embedding of short-open calibration technique in commercial MoM simulators for parameter extraction of planar integrated circuits

Abstract

In this paper, the short-open calibration (SOC) technique, which was originally proposed, developed and self-contained in a research-oriented full-wave method of moments (MoM) simulator, is imbedded for the first time in a commercial simulator for the modeling and parameter extraction of planar integrated circuits and discontinuities. The SOC technique requires only two standards, namely short and open standards, which can be easily realized in commercial MoM simulators. By removing inherent numerical noise and errors, accurate equivalent circuit model of the circuits can be extracted and developed. Two examples are presented to verify the effectiveness of the proposed method in conjunction with a commercial package of choice.