{"title":"An Extended Analysis of Reliability Test Data","authors":"T. Papanchev, J. Garipova","doi":"10.1109/ET50336.2020.9238212","DOIUrl":null,"url":null,"abstract":"This paper discusses the possibilities for detecting and evaluating additional information on the influence of various stressors on electronic devices when data from two-sreess factors accelerated tests are collected. Two approaches are considered - standard, with one fixed stress factor, and estimation by severity of impact by solving partial differential equations.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"110 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 XXIX International Scientific Conference Electronics (ET)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ET50336.2020.9238212","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper discusses the possibilities for detecting and evaluating additional information on the influence of various stressors on electronic devices when data from two-sreess factors accelerated tests are collected. Two approaches are considered - standard, with one fixed stress factor, and estimation by severity of impact by solving partial differential equations.
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