S. Nishi, Kazuhiko Tamesue, Toshio Sato, San Hlaing Myint, Takuro Sato, T. Kawanishi
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Abstract
The dielectric constant and dielectric loss tangent of various bonding films were evaluated by THz-Time Domain Spectroscopy (THz-TDS), and a bonding film with a small dielectric loss tangent in the 300 GHz band was found. Using this bonding film, a 4x4 element, 2-port antenna operating at 280 GHz was fabricated. The dielectric loss of the dielectric substrate was measured using a strip line loss evaluation pattern, and the dielectric loss tangent and surface roughness of the metal were determined to be consistent with the simulation. The antenna gain was found to be in good agreement with the measured antenna gain.
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