V. Melnik, Alexander N. Mikhailov, V. Grishkin, D. Ovsyannikov, Yevgeny V. Yelaev
{"title":"Modeling methods of the test inputs for analysis the digital devices","authors":"V. Melnik, Alexander N. Mikhailov, V. Grishkin, D. Ovsyannikov, Yevgeny V. Yelaev","doi":"10.1109/EMISSION.2014.6893969","DOIUrl":null,"url":null,"abstract":"The test check of complex digital devices is a difficult problem. The computer-aided design system (CAD) “SimTest” was developed so as to automate the process of digital device test-program making.","PeriodicalId":314830,"journal":{"name":"2014 2nd 2014 2nd International Conference on Emission Electronics (ICEE)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 2nd 2014 2nd International Conference on Emission Electronics (ICEE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMISSION.2014.6893969","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The test check of complex digital devices is a difficult problem. The computer-aided design system (CAD) “SimTest” was developed so as to automate the process of digital device test-program making.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
