Evolution of the cyclic stress-strain and constitutive behaviors of SAC305 lead free solder during fatigue testing

Nianjun Fu, J. Suhling, S. Hamasha, P. Lall
{"title":"Evolution of the cyclic stress-strain and constitutive behaviors of SAC305 lead free solder during fatigue testing","authors":"Nianjun Fu, J. Suhling, S. Hamasha, P. Lall","doi":"10.1109/ITHERM.2017.7992639","DOIUrl":null,"url":null,"abstract":"When exposed to a temperature changing environment, solder joints in electronic assemblies are subjected to cyclic thermal-mechanical loading due to the mismatches in coefficients of thermal expansion (CTE) of the different assembly materials. Eventually, the cyclic loading can result in fatigue failure of solder joints, which is one of the common failure modes in electronic packaging. While it has been known that the reversal of inelastic strain can change the stress-strain behavior of materials (Bauschinger effect), there have been few prior studies on how the cycling changes the microstructure and degrades the mechanical properties of lead free solders during fatigue testing. In this investigation, we have explored the effects of mechanical cycling on the cyclic stress-strain behavior (hysteresis loop area, plastic strain range, and peak stress) and on the constitutive behavior (stress-strain and creep) of SAC305 lead free solder in fatigue testing. At the same time, effects of cycling on solder microstructure have been studied. The goal of the study was to explore the damage accumulation that occurs during fatigue testing.","PeriodicalId":387542,"journal":{"name":"2017 16th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 16th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ITHERM.2017.7992639","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 21

Abstract

When exposed to a temperature changing environment, solder joints in electronic assemblies are subjected to cyclic thermal-mechanical loading due to the mismatches in coefficients of thermal expansion (CTE) of the different assembly materials. Eventually, the cyclic loading can result in fatigue failure of solder joints, which is one of the common failure modes in electronic packaging. While it has been known that the reversal of inelastic strain can change the stress-strain behavior of materials (Bauschinger effect), there have been few prior studies on how the cycling changes the microstructure and degrades the mechanical properties of lead free solders during fatigue testing. In this investigation, we have explored the effects of mechanical cycling on the cyclic stress-strain behavior (hysteresis loop area, plastic strain range, and peak stress) and on the constitutive behavior (stress-strain and creep) of SAC305 lead free solder in fatigue testing. At the same time, effects of cycling on solder microstructure have been studied. The goal of the study was to explore the damage accumulation that occurs during fatigue testing.
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SAC305无铅焊料疲劳试验中循环应力-应变及本构行为演变
当暴露在温度变化的环境中时,由于不同组装材料的热膨胀系数(CTE)不匹配,电子组件中的焊点受到循环热机械载荷。循环载荷最终会导致焊点的疲劳失效,这是电子封装中常见的失效模式之一。虽然已经知道非弹性应变的逆转可以改变材料的应力-应变行为(鲍辛格效应),但在疲劳测试中,循环如何改变微观结构和降低无铅焊料的力学性能的研究很少。在这项研究中,我们探讨了机械循环对SAC305无铅焊料在疲劳测试中的循环应力-应变行为(滞后回路面积、塑性应变范围和峰值应力)和本构行为(应力-应变和蠕变)的影响。同时,研究了循环对焊料组织的影响。该研究的目的是探索疲劳试验过程中发生的损伤累积。
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