An Inversion Method of Dielectric Material Characteristics at Terahertz Band

Abstract

Dielectric materials are widely used in various microwave, millimeter wave and terahertz devices. However, in the terahertz band, due to the factors such as expensive measurement instruments, many dielectric material characteristics are unknown, which makes the design of terahertz dielectric devices difficult. In this paper, a quasi-resonant material measurement method for the characteristics of dielectric materials is presented. Using the idea of lens antenna, the dielectric constant and the tangent of loss angle of dielectric at terahertz band are obtained by using the combined inversion of far-field measurement and full-wave simulation. Through the method of this paper, the dielectric constant and the loss tangent of Teflon near 216GHz has been obtained.