{"title":"BENeFITS - A step to ATE of the future","authors":"W. Ross, J.L. Hernandez","doi":"10.1109/AUTEST.1992.270140","DOIUrl":null,"url":null,"abstract":"The authors discuss the results of a proof-of-concept effort aimed at defining an automatic test equipment (ATE) architecture that incorporates both built-in-test (BIT) data and functional testing techniques. The concept, called BENeFITS (BIT-Enhanced Functional Test System), uses fault guided analysis techniques to process BIT failure data retrieved from the unit under test and perform functional testing only on the sections indicated by BIT. Other features include the use of software algorithms and artificial intelligence (AI) principles to improve fault callout accuracies over time.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"343 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1992.270140","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The authors discuss the results of a proof-of-concept effort aimed at defining an automatic test equipment (ATE) architecture that incorporates both built-in-test (BIT) data and functional testing techniques. The concept, called BENeFITS (BIT-Enhanced Functional Test System), uses fault guided analysis techniques to process BIT failure data retrieved from the unit under test and perform functional testing only on the sections indicated by BIT. Other features include the use of software algorithms and artificial intelligence (AI) principles to improve fault callout accuracies over time.<>
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