In-flight measurement of space radiation effects on commercial DRAM

Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004. Pub Date : 2004-12-06 DOI:10.1109/ICM.2004.1434703

T. Sasada, S. Ichikawa, T. Kanai

引用次数: 3

Abstract

To evaluate the characteristics of commercial memory devices, Japan Aerospace Exploration Agency (JAXA) launched a solid state recorder (SSR) on the mission demonstration test satellite-1 (MDS-1 or "Tsubasa") into geo-stationary transfer orbit (GTO) in February 2002. Passing through the Van Allen Belt exposed MDS-1 to severe radioactive rays in every orbit. This flight experiment measured the rate of single-event-upsets (SEUs) on a large number of stacked 64 Mbit dynamic random access memory (DRAM), and the distribution of total ionizing dose (TID) effects. As a result, we can calculate the actual SEU rate, and we confirmed the capabilities of two types of on-the-fly error detection and correction (EDAC) mechanisms. This paper presents the results of the space experiment of SSR, especially focusing on SEU analysis.

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商用DRAM空间辐射效应的飞行测量

为了评估商用存储设备的特性，日本宇宙航空研究开发机构(JAXA)于2002年2月在任务演示测试卫星-1 (MDS-1或“Tsubasa”)上发射了一个固态记录仪(SSR)进入地球静止转移轨道(GTO)。通过范艾伦带时，MDS-1在每个轨道上都暴露在强烈的放射性射线中。本飞行实验测量了大量堆叠64mbit动态随机存取存储器(DRAM)上的单事件扰动率(seu)，以及总电离剂量(TID)效应的分布。因此，我们可以计算出实际的SEU速率，并确认了两种类型的动态错误检测和纠正(EDAC)机制的能力。本文介绍了SSR空间实验的结果，重点介绍了单粒子分析。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004.

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