Built-in current testing versus delay fault testing-a case study

Abstract

Descriptions are given of the most significant types of defects and their implication on delay effects and overcurrents for different classes of CMOS circuits. Delay fault testing and built-in current testing have emerged as the most promising methods in CMOS testing for high fault coverage. Based on different types of transistor circuits, an analysis is performed to investigate the fault coverage potential of both methods for transistor faults and bridging faults.<>