Stacked DBC Cavitied Substrate for a 15-kV Half-bridge Power Module

A. Deshpande, F. Luo, A. Iradukunda, D. Huitink, L. Boteler
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引用次数: 16

Abstract

High-voltage (3.3 – 10 kV) SiC power switching devices are on the verge of commercialization, while devices rated 15 kV and above are expected in the future. Consequently, there is an increasing demand for power modules that reliably packages them in common topologies for high-performance, while using standard manufacturing processes. This paper presents a solution to utilize direct-bonded-copper (DBC), which is a conventional low-voltage power module substrate, for highvoltage (15 kV) half-bridge power module packaging. The concept involves stacking multiple DBCs with the top-surface metallization pattern replicated on each inter-layer and the bottom-surface metallization. The consequent formation of the interlayer cavities within the stacked substrate creates a series-connected multi-layer capacitor under the DC+, DC−, and AC top-surface metallization. The multi-layer capacitors, where the DBC ceramic acts as the dielectric, equally distribute the high-voltage on the top-surface metallization across each ceramic under it. The voltage distribution enables minimization of the electric fields at the critical triple-point and within the bulk of ceramic. The proposed stacking allows bypassing the need for a voltage-clamped interlayer metallization. A multi-domain (electrical, thermal, mechanical) parametric analysis was performed to determine the number of ceramic layers and total ceramic thickness in the stack. The performed analysis qualitatively demonstrated the effectiveness of the proposed solution with an underlying trade-off.
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用于15kv半桥电源模块的堆叠DBC空腔基板
高压(3.3 - 10kv) SiC功率开关器件正处于商业化的边缘,而15kv及以上的器件有望在未来实现商业化。因此,在使用标准制造工艺的同时,对可靠地封装在通用拓扑中以实现高性能的电源模块的需求不断增加。本文提出了一种利用传统低压功率模块基板DBC进行高压(15kv)半桥功率模块封装的解决方案。该概念涉及堆叠多个DBCs,在每个中间层上复制上表面金属化模式和下表面金属化。在堆叠衬底内形成层间腔,在DC+、DC−和AC顶表面金属化下形成串联的多层电容器。在多层电容器中,DBC陶瓷充当电介质,将上表面金属化上的高压均匀地分布在其下的每个陶瓷上。电压分布使得在临界三相点和陶瓷内部的电场最小化。所提出的堆叠允许绕过电压箝位层间金属化的需要。进行了多领域(电、热、机械)参数分析,以确定陶瓷层数和堆栈中的总陶瓷厚度。所执行的分析定性地证明了提出的解决方案的有效性与潜在的权衡。
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