{"title":"Shape from focus system","authors":"S. Nayar","doi":"10.1109/CVPR.1992.223259","DOIUrl":null,"url":null,"abstract":"A shape-from-focus method that uses different focus levels to obtain a sequence of object images is described. A sum-modified-Laplacian operator is developed to provide local measures of the quality of image focus. The operator is applied to the sequence of images of the object to determine a set of focus measures as each image point. A model is developed to describe the variation of focus measure values due to defocusing. This model is used by a depth estimation algorithm to interpolate focus measure values and obtain accurate depth estimates. A fully automated system that has been implemented using an optical microscope and tested on a variety of industrial samples is described.<<ETX>>","PeriodicalId":325476,"journal":{"name":"Proceedings 1992 IEEE Computer Society Conference on Computer Vision and Pattern Recognition","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"135","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1992 IEEE Computer Society Conference on Computer Vision and Pattern Recognition","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CVPR.1992.223259","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 135
Abstract
A shape-from-focus method that uses different focus levels to obtain a sequence of object images is described. A sum-modified-Laplacian operator is developed to provide local measures of the quality of image focus. The operator is applied to the sequence of images of the object to determine a set of focus measures as each image point. A model is developed to describe the variation of focus measure values due to defocusing. This model is used by a depth estimation algorithm to interpolate focus measure values and obtain accurate depth estimates. A fully automated system that has been implemented using an optical microscope and tested on a variety of industrial samples is described.<>
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