A multidrop optical network testbed for EPON platform

M. Majid, N. M. Din, Md. Zaini Jamaludin, M. Al-Mansoori, I. S. Mustafa, Nurul Asyikin Mohd Radzi, S. Sadon
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Abstract

In an Ethernet Passive Optical Network (EPON) environment, the Optical Line Terminal (OLT) and Optical Network Unit (ONU) are the main end components that are required for the transfer of data. For the data transmission process, a communication protocol, i.e Multi-Point Control Protocol (MPCP) is required to avoid collision of the data that travel between the OLT and ONU. This paper describes an effort in developing an EPON environment with MPCP for the OLT and ONU communications. A multidrop optical network testbed was developed on a platform intergrated with PIC microcontrollers. Although the microcontrollers have some limitations, the testbed can be used to test out protocols and algorithms for the EPON environment.
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EPON平台的多点光网络测试平台
在以太网无源光网络(EPON)环境中,OLT (Optical Line Terminal)和光网络单元ONU (Optical Network Unit)是传输数据所需的主要端元器件。在数据传输过程中,需要一个通信协议,即多点控制协议(MPCP),以避免在OLT和ONU之间传输的数据发生碰撞。本文介绍了在OLT和ONU通信中使用MPCP开发EPON环境的工作。在PIC单片机集成平台上开发了一个多点光网络测试平台。虽然微控制器有一定的局限性,但测试平台可以用于测试EPON环境的协议和算法。
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