Chi-Hsien Wu, Jau‐Ji Jou, Hsin-Wen Ting, Shao-I Chu, Bing-Hong Liu
{"title":"Multi-channel multi-gigabit PRBS generator with a built-in clock in 0.18-μm CMOS technology","authors":"Chi-Hsien Wu, Jau‐Ji Jou, Hsin-Wen Ting, Shao-I Chu, Bing-Hong Liu","doi":"10.1109/ISOCC.2017.8368893","DOIUrl":null,"url":null,"abstract":"In this paper, a parallel pseudo-random bit sequence (PRBS) generator circuit with a built-in clock was designed in 0.18μm CMOS Technology. For high-speed operation, the current-mode logic (CML) was used in the circuit. In the PRBS generator, four-channel 2-Gb/s and two-channel 4-Gb/s PRBS signals can be generated. The power consumption of the chip is 554.3-mW at 1.8-V of power supply, and the chip area is 1.196×1.01-mm2. The PRBS generator can be suitable in multi-level modulation and multi-channel transmission tests.","PeriodicalId":248826,"journal":{"name":"2017 International SoC Design Conference (ISOCC)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 International SoC Design Conference (ISOCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISOCC.2017.8368893","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
In this paper, a parallel pseudo-random bit sequence (PRBS) generator circuit with a built-in clock was designed in 0.18μm CMOS Technology. For high-speed operation, the current-mode logic (CML) was used in the circuit. In the PRBS generator, four-channel 2-Gb/s and two-channel 4-Gb/s PRBS signals can be generated. The power consumption of the chip is 554.3-mW at 1.8-V of power supply, and the chip area is 1.196×1.01-mm2. The PRBS generator can be suitable in multi-level modulation and multi-channel transmission tests.