Fault Diagnosis Method for Complex Electronic System

Abstract

This paper proposes a fault diagnosis method for the complex electronic system based on multi-source diagnostic information such as complex electronic system topological connections, fault propagation effects, abnormal event information, usage time, and mean time between failures (MTBF), which are relatively easy to obtain under conditions such as airborne, shipborne, vehicle-mounted, and spaceborne, etc. Firstly, the basis of directed graph theory and fault propagation capability index matrix are used to describe the diagnosis problem. Secondly, the robustness index, credibility index and the remaining life index are composited to obtain fault diagnosis index. Lastly, a simulation example is given to demonstrate the efficiency of the proposed diagnosis algorithm. which not only realizes the integration of multi-source diagnostic information of each component of the complex electronic system in space and time, but also reduces the dependence of fault diagnosis on special test equipment.