{"title":"Thin film transistors modeling and parameters extraction tool","authors":"O. Declerck, J. Bardyn","doi":"10.1109/EASIC.1990.207984","DOIUrl":null,"url":null,"abstract":"Presents a parameters extraction tool for transistors modeling activity, which gives way to characterize not only MOS processes but also to check and validate four terminal transistor models such as polysilicon thin film transistors.<<ETX>>","PeriodicalId":205695,"journal":{"name":"[Proceedings] EURO ASIC `90","volume":"23 2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[Proceedings] EURO ASIC `90","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EASIC.1990.207984","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
Presents a parameters extraction tool for transistors modeling activity, which gives way to characterize not only MOS processes but also to check and validate four terminal transistor models such as polysilicon thin film transistors.<>
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