S. Borkar, T. Karnik, S. Narendra, J. Tschanz, A. Keshavarzi, V. De
{"title":"Parameter variations and impact on circuits and microarchitecture","authors":"S. Borkar, T. Karnik, S. Narendra, J. Tschanz, A. Keshavarzi, V. De","doi":"10.1145/775832.775920","DOIUrl":null,"url":null,"abstract":"Parameter variation in scaled technologies beyond 90nm will pose a major challenge for design of future high performance microprocessors. In this paper, we discuss process, voltage and temperature variations; and their impact on circuit and microarchitecture. Possible solutions to reduce the impact of parameter variations and to achieve higher frequency bins are also presented.","PeriodicalId":167477,"journal":{"name":"Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)","volume":"67 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1526","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/775832.775920","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1526
Abstract
Parameter variation in scaled technologies beyond 90nm will pose a major challenge for design of future high performance microprocessors. In this paper, we discuss process, voltage and temperature variations; and their impact on circuit and microarchitecture. Possible solutions to reduce the impact of parameter variations and to achieve higher frequency bins are also presented.
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