Generation of compact multi-cycle diagnostic test sets

Abstract

The possibility of achieving test compaction by using multi-cycle tests led to the development of procedures that produce compact multi-cycle test sets for the detection of single stuck-at faults, for the detection of transition faults, and for n-detections of single stuck-at faults [1]-[4]. The advantages of compact diagnostic test sets motivated the development of the test compaction procedures from [5]-[7]. These procedures were applied to produce compact single-cycle diagnostic test sets. The procedure described in this paper achieves test compaction for diagnostic test sets by using multi-cycle tests to replace single-cycle tests in a compact single-cycle diagnostic test set.