{"title":"Back-gated SOI technology: power-adaptive logic and non-volatile memory using identical processing","authors":"U. Avci, A. Kumar, Haitao Liu, S. Tiwari","doi":"10.1109/ESSDER.2004.1356545","DOIUrl":null,"url":null,"abstract":"A back-gated scalable silicon-on-insulator (SOI) technology that provides a non-volatile memory, logic with adaptive power-performance trade-off and buried interconnectivity is reported. The back-gate approach has the following characteristics: (1) a logic transistor whose threshold voltage modulation allows adaptive power control of digital and analog circuits, (2) a non-volatile memory where the read-transistor scaling is decoupled from storage constraints, (3) good SOI thickness control, (4) speed degradation due to alignment tolerances lower than 16%, (5) a new analog design approach to achieve adaptive low voltage operation within digital constraints.","PeriodicalId":287103,"journal":{"name":"Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850)","volume":"183 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-11-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDER.2004.1356545","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
A back-gated scalable silicon-on-insulator (SOI) technology that provides a non-volatile memory, logic with adaptive power-performance trade-off and buried interconnectivity is reported. The back-gate approach has the following characteristics: (1) a logic transistor whose threshold voltage modulation allows adaptive power control of digital and analog circuits, (2) a non-volatile memory where the read-transistor scaling is decoupled from storage constraints, (3) good SOI thickness control, (4) speed degradation due to alignment tolerances lower than 16%, (5) a new analog design approach to achieve adaptive low voltage operation within digital constraints.
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