P. Garcia, J. L. del Valle, Y. Matsumoto, K. Akinade, H.E. Aldrete
{"title":"The use of T-CAD tool for yield improvement on fast-switching power rectifiers","authors":"P. Garcia, J. L. del Valle, Y. Matsumoto, K. Akinade, H.E. Aldrete","doi":"10.1109/ICCDCS.2002.1004029","DOIUrl":null,"url":null,"abstract":"Technological changes for mature devices are not as straightforward as one wishes. Reducing learning curve time is a must to remain competitive in the market share. This paper present a method based on device physics and simulation using T-CAD tool coupled with a virtual DOE technique to assess yield improvement and learning curve reduction. The method is applied to platinum doped fast switching power rectifiers.","PeriodicalId":416680,"journal":{"name":"Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611)","volume":"96 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCDCS.2002.1004029","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Technological changes for mature devices are not as straightforward as one wishes. Reducing learning curve time is a must to remain competitive in the market share. This paper present a method based on device physics and simulation using T-CAD tool coupled with a virtual DOE technique to assess yield improvement and learning curve reduction. The method is applied to platinum doped fast switching power rectifiers.
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