Tianbing Chen, B. Vijayakumar, Tzung-yin Lee, C. Huang, M. McPartlin
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Abstract
In this work, the thermal coupling resistance (R12) between the reference transistor and the output transistor in a current mirror is characterized by two different measurement techniques: the constant voltage, and the constant current R12 extractions. The extracted R12 from both methods are very similar. The constant voltage method is deemed to be more physical or accurate than the constant current method. Further TCAD simulation agrees well with R12 measurement data.
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