Characterization of NiCrOx thin films deposited by reactive sputtering at different O2 flow rate

He Yu, Tao Wang, Shuanghong Wu, Xiang Dong, Jun Gou, Xiaohui Wang, Yadong Jiang, Rui Wu
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Abstract

NiCrOx thin films were prepared by DC reactive magnetron sputtering from a NiCr metal target in Ar+O2 with the different O2 gas flow varied from 0 to 6 seem. The influence of the O2 flow rate on the deposition rate, film composition and optical properties were investigated. EDX detected a decrease in the Cr concentration with the increasing of oxygen flow rate due to the preferential oxidation of Cr to Cr2O3. The deposition rate decreases dramatically at oxygen flow of 2.6 seem, corresponding to the transition point from metal mode to compound mode on the target. Furthermore, an original numerical model, based on the standard Berg model was used to calculate the composition evaluation and deposition rate of NiCrOx films. Results show a reasonable agreement between numerical and experimental data.
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不同O2流速下反应溅射沉积NiCrOx薄膜的表征
采用直流反应磁控溅射法制备了NiCr金属靶材的NiCrOx薄膜,溅射条件为Ar+O2, O2流量为0 ~ 6 μ m。研究了O2流速对沉积速率、膜组成和光学性能的影响。EDX检测到Cr浓度随着氧流量的增加而降低,这是由于Cr优先氧化为Cr2O3。当氧流量为2.6时,沉积速率急剧下降,这与靶材上从金属模式到复合模式的过渡点相对应。在标准Berg模型的基础上,建立了原始的数值模型,计算了NiCrOx薄膜的成分评价和沉积速率。结果表明,数值与实验数据吻合较好。
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