High voltage driver built in a low voltage 0.18 /spl mu/m CMOS for cache redundancy applications in microprocessors

A. Bergemont, I. Saadat, P. Francis, C. Pichler, H. Haggag, A. Kalnitsky
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Abstract

The manufacturability and integration of a high voltage driver transistor built in a 0.18 /spl mu/m CMOS process is demonstrated and evaluated. This paper addresses the driver circuit challenges for fuse programming. Given the low operating voltage nature of the 0.18 /spl mu/m technology, this driver still delivers the required programming energy, yet complying with low voltage limitation of the technology. This transistor is based on extended drain approach and does not require additional masking steps for manufacturing. The transistor is capable of operating up to V/sub d/=15 V and I/sub dsat//W=250 /spl mu/A//spl mu/m at Vg=1.8 V. The reliability of this high voltage driver is also addressed.
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高压驱动器内置在一个低电压0.18 /spl μ m CMOS缓存冗余应用在微处理器
对采用0.18 /spl mu/m CMOS工艺的高压驱动晶体管的可制造性和集成度进行了论证和评估。本文讨论了保险丝编程中驱动电路的挑战。鉴于0.18 /spl mu/m技术的低工作电压特性,该驱动器仍然提供所需的编程能量,但符合该技术的低电压限制。这种晶体管是基于扩展漏极方法,不需要额外的屏蔽步骤制造。该晶体管能够在Vg=1.8 V时工作高达V/sub d/=15 V和I/sub dsat//W=250 /spl mu/A//spl mu/m。文中还讨论了高压驱动器的可靠性。
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