{"title":"Multiple fault detection and location in WSI baseline interconnection networks","authors":"C. Feng, W. Huang, F. Lombardi","doi":"10.1109/ICWSI.1990.63895","DOIUrl":null,"url":null,"abstract":"Presents an approach for the full diagnosis (detection and location) of baseline interconnection networks implemented in WSI. A multiple fault model as applicable to production of these devices, is assumed. This implies that a totally exhaustive combinatorial fault model is used in the analysis. It is proved that the maximum number of tests for detecting multiple faults (i.e. 2(1+log/sub 2/N), where N is the number of inputs/outputs), can be used to locate and identify multiple faulty switching elements provided that no intermittent and/or transient behaviour is present, i.e. using the definition of no logically undefined and no undetermined outputs are present. The proposed diagnostic technique is based on a process which reveals the switching state of each element on a stage by stage basis using the test set. No additional hardware is therefore required. The proposed technique can be efficiently used in the manufacturing of complex interconnection networks using advanced integration techniques such as WSI.<<ETX>>","PeriodicalId":206140,"journal":{"name":"1990 Proceedings. International Conference on Wafer Scale Integration","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1990 Proceedings. International Conference on Wafer Scale Integration","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICWSI.1990.63895","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
Presents an approach for the full diagnosis (detection and location) of baseline interconnection networks implemented in WSI. A multiple fault model as applicable to production of these devices, is assumed. This implies that a totally exhaustive combinatorial fault model is used in the analysis. It is proved that the maximum number of tests for detecting multiple faults (i.e. 2(1+log/sub 2/N), where N is the number of inputs/outputs), can be used to locate and identify multiple faulty switching elements provided that no intermittent and/or transient behaviour is present, i.e. using the definition of no logically undefined and no undetermined outputs are present. The proposed diagnostic technique is based on a process which reveals the switching state of each element on a stage by stage basis using the test set. No additional hardware is therefore required. The proposed technique can be efficiently used in the manufacturing of complex interconnection networks using advanced integration techniques such as WSI.<>