E. van Brunt, Thomas Barbieri, A. Barkley, Jim Solovey, J. Richmond, B. Hull
{"title":"Surge current failure mechanisms in 4H-SiC JBS rectifiers","authors":"E. van Brunt, Thomas Barbieri, A. Barkley, Jim Solovey, J. Richmond, B. Hull","doi":"10.1109/ISPSD.2018.8393691","DOIUrl":null,"url":null,"abstract":"4H-SÍC Junction Barrier Schottky (JBS) rectifiers can operate in both a purely unipolar mode during normal operation, and a bipolar mode during surge conditions. The transition between operation modes is not only a function of the static device physics, but also the dynamic heating that occurs during a surge transient. For long surge transients on the order of 1ms, heat diffusion into the package allows for 4H-SiC JBS diodes to absorb up to an order of magnitude more energy than surge transients that occur in the 10 μβ time scale. Data from surge operation of 4H-SiC diodes at varying time scales was used to map surge currents to an allowed operation space.","PeriodicalId":166809,"journal":{"name":"2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.2018.8393691","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
4H-SÍC Junction Barrier Schottky (JBS) rectifiers can operate in both a purely unipolar mode during normal operation, and a bipolar mode during surge conditions. The transition between operation modes is not only a function of the static device physics, but also the dynamic heating that occurs during a surge transient. For long surge transients on the order of 1ms, heat diffusion into the package allows for 4H-SiC JBS diodes to absorb up to an order of magnitude more energy than surge transients that occur in the 10 μβ time scale. Data from surge operation of 4H-SiC diodes at varying time scales was used to map surge currents to an allowed operation space.